In the semiconductor industry, where device miniaturization (e.g., 3nm–5nm process nodes) and testing precision continue to advance, micro-coaxial cables have emerged as critical components in ensuring reliable signal transmission during quality verification. Unlike standard coaxial cables, their ultra-fine structure, low signal loss, and robust shielding make them indispensable for capturing accurate data in high-frequency, space-constrained testing environments—directly impacting the efficiency of semiconductor production and the reliability of end products.
Semiconductor testing demands cables that can maintain signal integrity while withstanding harsh operational conditions (e.g., repeated 插拔,narrow test chambers). Below are the non-negotiable performance metrics:
Micro-coaxial cables are not one-size-fits-all; their design varies by testing stage and device type:
During WLT, cables connect the test head to probe cards, which directly contact individual die on a wafer. Given the wafer’s small die pitch (often <0.5mm), micro-coaxial cables here require ultra-fine diameters (0.3mm–0.8mm outer diameter) to fit into compact probe stations. They also need low capacitance (≤10pF/m) to avoid loading the die’s input/output (I/O) ports, which could skew voltage/current test readings.
After dicing and packaging, chips undergo FDT to validate functionality. Micro-coaxial cables in this stage connect test sockets to the test system’s signal generators and analyzers. Since packaged chips (e.g., QFP, BGA) may require multi-channel testing, cables are often bundled into flexible assemblies with precise length matching (±1mm) to ensure synchronized signal transmission across all channels.
For power semiconductors (e.g., IGBTs, SiC chips), testing involves high current (up to 100A) and high voltage (up to 1kV). Micro-coaxial cables for this niche need thicker conductors (e.g., 0.2mm diameter silver-plated copper) to handle current without overheating, while their insulation must have high dielectric strength (≥20kV/mm) to prevent breakdown during voltage tests.
Engineers often face trade-offs when choosing micro-coaxial cables for semiconductor testing. Here’s how to resolve key pain points:
When precision and reliability in semiconductor testing cannot be compromised, FRS stands out as a factory with deep expertise in micro-coaxial solutions tailored to your needs. FRS’s micro-coaxial cables meet the strictest performance standards for semiconductor testing: they offer characteristic impedance tolerance as tight as ±1Ω, insertion loss <0.5dB/m at 20GHz, and shielding 效能>95dB at 1GHz—ensuring your test data is accurate and consistent.
Whether you need ultra-fine cables for wafer-level testing, length-matched assemblies for multi-channel FDT, or high-power-rated cables for SiC/IGBT testing, FRS provides end-to-end customization: from material selection (e.g., high-temperature FEP insulation for harsh test environments) to connector integration (compatible with all major probe card and test system brands). With rigorous quality control (100% impedance and loss testing before shipment) and fast lead times (2–4 weeks for custom orders), FRS helps you minimize testing downtime and maintain the highest standards for your semiconductor products.
For semiconductor testing cables that deliver uncompromised performance, FRS is the factory you can rely on.
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